A Korean team of scientists have succeeded in developing a neutron reflectometer (REF) used in the study of semiconductors' surface composed of high-tech materials such as nano and bioinspired materials as well as magnetic bubble memories. Dr. Lee Jung-soo, who led the Korean team of scientists at the Korea Atomic Energy Research Institute (KAERI), said on May 25 that the neutron reflectometer, which can analyze the structure of thin films (1~500nm) to the nano digits, was developed by using only the local technologies. Since the reflectometer is operated by using neutrons with extremely low energies, Lee added, it has the benefit of not inflicting any damage, whether be it physical or chemical, to the materials being measured. Through this development, he said, Korea joins the only five or so countries possessing the advanced technology.